JPS59148251U - ウエハプロ−バの測定針研磨装置 - Google Patents
ウエハプロ−バの測定針研磨装置Info
- Publication number
- JPS59148251U JPS59148251U JP4119183U JP4119183U JPS59148251U JP S59148251 U JPS59148251 U JP S59148251U JP 4119183 U JP4119183 U JP 4119183U JP 4119183 U JP4119183 U JP 4119183U JP S59148251 U JPS59148251 U JP S59148251U
- Authority
- JP
- Japan
- Prior art keywords
- polishing device
- wafer prober
- measurement needle
- needle polishing
- wafer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 title claims description 5
- 238000005259 measurement Methods 0.000 title 1
- 239000000523 sample Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4119183U JPS59148251U (ja) | 1983-03-21 | 1983-03-21 | ウエハプロ−バの測定針研磨装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4119183U JPS59148251U (ja) | 1983-03-21 | 1983-03-21 | ウエハプロ−バの測定針研磨装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59148251U true JPS59148251U (ja) | 1984-10-03 |
JPS64270Y2 JPS64270Y2 (en]) | 1989-01-06 |
Family
ID=30171785
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4119183U Granted JPS59148251U (ja) | 1983-03-21 | 1983-03-21 | ウエハプロ−バの測定針研磨装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59148251U (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH022939A (ja) * | 1988-06-13 | 1990-01-08 | Tokyo Electron Ltd | プローブ装置および検査方法 |
-
1983
- 1983-03-21 JP JP4119183U patent/JPS59148251U/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH022939A (ja) * | 1988-06-13 | 1990-01-08 | Tokyo Electron Ltd | プローブ装置および検査方法 |
Also Published As
Publication number | Publication date |
---|---|
JPS64270Y2 (en]) | 1989-01-06 |
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